Power Semiconductor Testers

AGVA Technologies has a range of power semiconductor test products for both volume production testing and characterization lab use.

ITC52300

ITC52300

The ITC52300 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment.

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ITC55100C

ITC55100C

Model ITC55100C is the latest generation of the industry standard series of ITC55100 testers. The system has been designed around a very powerful micro-controller that gives it a timing resolution of 40ns, twenty times faster than the previous model.

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ITC55100STD

ITC55100STD

The ITC55100STD is a single site 100A version of the industry standard series of ITC55100 testers. Single test port and a maximum drain current capability of 100A for improved price/performance in single DUT production testing applications.

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ITC55300C

ITC55300C

Model ITC55300C is the high current (400A) version of the ITC55100C tester. The ITC55300C performs the same tests as the ITC55100C and includes many features that improve testing accuracy, test results collection, test results viewing, and multiple tester networking.

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ITC55350C

ITC55350C

Model ITC55350 is the high current (600A) version of the ITC55100 tester. The ITC55350 performsthe same tests as the ITC55100 and includes many features that improve testing accuracy, test results collection, test results viewing, and multiple tester networking.

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ITC57300

ITC57300

The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices.

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ITC59100 Rg/Qg

ITC59100 Rg/Qg

The ITC59100 Test Measurement Unit (TMU), which plugs into the ITC59000 Test Platform, performs gate charge (Qg) measurements that conform to MIL-STD-750C, Notice 2, Method 3471 and JEDEC Standard JESD24-2.

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ITC75100

ITC75100

The ITC75100 is an enhanced unclamped inductive load (UIL) test system that builds on the success of ITC’s industry leading ITC55 series of testers by adding additional test and measurement capability.

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ITC75300

ITC75300

The ITC75300 is a 400 amp version of the ITC75100 which performs ruggedness testing of power MOSFET’s, IGBT’s and diodes that conforms to MIL-STD-750 method 3470 by stressing them to controlled energy levels, accomplished by the devices driving an unclamped inductive load.

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Test Accessories

Test Accessories

These accessories are available for ITC test equipment: WPS, Crowbar, Load Boxes and TSM Accessories.

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