AGVA Technologies has a complete range of probe card metrology products that address all probe technologies, probe card sizes and probe counts.
The PB1200 is an automated probe card repair system. It has the capability to fully test alignment, planarity and (optionally) gram force, but its main purpose is in card repair.
ViewThe PB1500 is a low cost probe card analyzer system. It has the capability to perform all the tests done on the larger PB3600/6500 probe card analyzers, but at a lower cost for low pincount cards.
ViewThe PB3600 provides the latest techniques in testing and maintaining probe cards. An ergonomic analyzer with the greatest measurement resolution, highest throughput, most flexibility and still made it easy to use.
ViewThe Probilt PB6500 has many features that make it the ideal analyzer for all probe card technologies, including the latest probe tip geometries being used to test leading edge semiconductor devices.
ViewProbilt’s PB6800 large measurement chuck allows probe arrays as big as 300 mm in diameter to be touched down without overhanging the chuck surface.
ViewMotherboards, ProbeTracker™, and Hot Chucks available for ITC's Probilt™ Probe Card Analyzer systems.
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