Probing Solutions

AGVA Technologies has a complete range of manual wafer probing systems ideal for virtually any application on a wide variety of semiconductor devices, materials and applications.

Manual Probe System α200CS α300CS

Manual Probe System α200CS α300CS

Temperature characteristic evaluation from -60 °C to +350 °C

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Manual Probe System α150 α200 α300

Manual Probe System α150 α200 α300

α series manual probe system is easy to use and can be used for various measurement applications.

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Manual Probe System α100

Manual Probe System α100

4 inch Manual Probe System with for accurate and reliable IV/CV, RF and measurements

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Compact Desktop Prober MBP-55

Compact Desktop Prober MBP-55

Compact prober optimized for chip level IV/CV measurement

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Semi-Auto Prober

Semi-Auto Prober

Temperature characteristic evaluation from -60°C to +350°C. Probe solution for high-power devices. 20kV DC/200A

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Vacuum Probe Station

Vacuum Probe Station

Evaluation of temperature characteristics at extremely low to very high temperatures, vacuum environment, gas environment measurement.

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Thermo Hot Chuck

Thermo Hot Chuck

Chuckstage that can control temperature of heating and cooling

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Positioners & Accessories

Positioners & Accessories

M60 Micromanipulator for high frequency probe, coaxial probe arm and more

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Probe Cards

Probe Cards

Parametric Probe card, Probe Card for High Power Measurement and more

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