Parametric Probe Card
- Enable to measure under the low / high temperature（-55 deg.C～200 deg.C ）
- Measurable the low current（<10ｆA)
- Corresponding with Agilent 4060,4070,4080
Probe Card for High Power Measurement
Supports voltage application of 10 kV or more and large current measurement of 200 A or more.
- Correspondence of 1 o kV, 200 A or more
- Structure to prevent discharge at high voltage
- High current support using iridium needle
- Connection to each measuring instrument
- Supports from development line to mass production line
DC Multi-contact Probe
It can be installed in the positioner with the s a me shape as the high frequency probe.
- Possible up to 20 pins
- Can be made with tungsten, BeCu, Pd, Ir needle
Probe Card for High Frequency Measurement
Use coaxial probe to achieve superior high frequency characteristics.
- Excellent high frequency characteristics
- Reduced test cost
- Quick delivery
Usage examples:
- SAW filter
- RF switch
- LNA
- Bluetooth, IC for wireless LA
Probe Card for Measuring Small Current
Measurement at high temperature, small current measurement possible
- Low temperature -60°C to 350°C
- Minimum current measurement at fA level
- 4.5 inch rectangular substrate compatible
- 4070/4080 tester compatible